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Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
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Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
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Date
2008
Proceedings Paper
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17783.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, A.
;
Tazzoli, A.
;
Gerardin, S.
;
Simoen, Eddy
;
Claeys, Cor
;
Meneghesso, G.
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1930
since deposited on 2021-10-17
Acq. date: 2025-12-11
Citations
Metrics
Views
1930
since deposited on 2021-10-17
Acq. date: 2025-12-11
Citations