Publication:

Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1931 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-01-07

Citations

Metrics

Views

1931 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-01-07

Citations