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Conference contributions
ESD reliability issues in RF CMOS circuits
Publication:
ESD reliability issues in RF CMOS circuits
Date
2002
Proceedings Paper
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5618.pdf
7.69 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Radhakrishnan, M. K.
;
Vassilev, Vesselin
;
Keppens, Bart
;
De Heyn, Vincent
;
Mahadeva Iyer, Natarajan
;
Groeseneken, Guido
Journal
Abstract
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2007
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2007
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations