Publication:

Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry

Date

2023
Journal article
https://doi.org/10.1364/OE.499397
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dc.contributor.authorTang, Ruizhi
dc.contributor.authorOrganista, Caori
dc.contributor.authorRomano, Lucia
dc.contributor.authorvan Hoorebeke, Luc
dc.contributor.authorStampanoni, Marco
dc.contributor.authorAelterman, Jan
dc.contributor.authorBoone, Matthieu n.
dc.contributor.imecauthorAelterman, Jan
dc.contributor.orcidimecAelterman, Jan::0000-0002-5543-2631
dc.date.accessioned2024-01-15T13:39:19Z
dc.date.available2024-01-08T17:19:02Z
dc.date.available2024-01-15T13:39:19Z
dc.date.embargo2023-11-20
dc.date.issued2023
dc.description.wosFundingTextInterreg Vlaanderen-Nederland (Smart*Light) ; European Regional Development Fund (Smart*Light) ; Provincie Oost-Vlaanderen (Smart*Light) ; Fonds Wetenschappelijk Onderzoek (3179I12018) ; Schweizerischer National-fonds zur Foerderung der Wissenschaftlichen Forschung (CRSII5_183568) ; Personalized Health and Related Technologies (PHRT) (2022-572) .
dc.identifier.doi10.1364/OE.499397
dc.identifier.issn1094-4087
dc.identifier.pmidMEDLINE:38041345
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43364
dc.publisherOptica Publishing Group
dc.source.beginpage40450
dc.source.endpage40468
dc.source.issue24
dc.source.journalOPTICS EXPRESS
dc.source.numberofpages19
dc.source.volume31
dc.subject.keywordsVISIBILITY-CONTRAST
dc.title

Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry

dc.typeJournal article
dspace.entity.typePublication
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