Interface states beyond band gap and their impact on charge carrier mobility in MOSFETs

dc.contributor.author	Ji, Z.
dc.contributor.author	Zhang, J. F.
dc.contributor.author	Zhang, W. D.
dc.contributor.author	Kaczer, Ben
dc.contributor.author	De Gendt, Stefan
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	De Gendt, Stefan
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	De Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned	2021-10-20T11:53:44Z
dc.date.available	2021-10-20T11:53:44Z
dc.date.issued	2012
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/20867
dc.identifier.url	http://dx.doi.org/10.1109/TED.2011.2177839
dc.source.beginpage	783
dc.source.endpage	790
dc.source.issue	3
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	59
dc.title	Interface states beyond band gap and their impact on charge carrier mobility in MOSFETs
dc.type	Journal article
dspace.entity.type	Publication
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