Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality

dc.contributor.author	Vandamme, Ewout
dc.contributor.author	Vandamme, Lorenz
dc.date.accessioned	2021-10-14T14:05:51Z
dc.date.available	2021-10-14T14:05:51Z
dc.date.issued	2000
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/4864
dc.source.beginpage	1847
dc.source.endpage	1853
dc.source.issue	11
dc.source.journal	Microelectronics Reliability
dc.source.volume	40
dc.title	Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality
dc.type	Journal article
dspace.entity.type	Publication
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