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Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methods

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dc.contributor.authorO'connor, Eamon
dc.contributor.authorMonaghan, S.
dc.contributor.authorLong, R.D.
dc.contributor.authorO'Mahony, A.
dc.contributor.authorPovey, I.M.
dc.contributor.authorCherkaoui, K.
dc.contributor.authorPemble, M.E.
dc.contributor.authorBrammertz, Guy
dc.contributor.authorHeyns, Marc
dc.contributor.authorNewcomb, S.
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorHurley, P.
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.date.accessioned2021-10-18T01:13:45Z
dc.date.available2021-10-18T01:13:45Z
dc.date.issued2009-03
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15936
dc.identifier.urlhttp://scitation.aip.org/vsearch/servlet/VerityServlet?KEY=APPLAB&ONLINE=YES&smode=strresults&sort=chron&maxdisp=25&threshold=0&
dc.source.beginpage102902
dc.source.issue10
dc.source.journalApplied Physics Letters
dc.source.volume94
dc.title

Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methods

dc.typeJournal article
dspace.entity.typePublication
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