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First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping
Publication:
First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Minari, Hideki
;
Yoshida, Shinichi
;
Sawada, Ken
;
Nakazawa, Masashi
;
Caymax, Matty
;
Merckling, Clement
;
Waldron, Niamh
;
Guo, Weiming
;
Jiang, Sijia
;
Collaert, Nadine
;
Simoen, Eddy
;
Lin, Dennis
;
Pourtois, Geoffrey
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Abstract
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1961
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1961
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations