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Reliability testing of InP HEMT's using electrical stress methods
Publication:
Reliability testing of InP HEMT's using electrical stress methods
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van der Zanden, Koen
;
Schreurs, Dominique
;
Menozzi, R.
;
Borgarino, M.
Journal
IEEE Trans. Electron Devices
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1911
since deposited on 2021-10-14
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1911
since deposited on 2021-10-14
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations