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Modeling challenges in nanoelectronics: an atomistic point of view

Date

2012
Meeting abstract
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dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorClima, Sergiu
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorHoussa, Michel
dc.contributor.authorEyben, Pierre
dc.contributor.authorSioncke, Sonja
dc.contributor.authorMagnus, Wim
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-20T14:47:08Z
dc.date.available2021-10-20T14:47:08Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21330
dc.source.conferenceConference on Computational Physics - CCP
dc.source.conferencedate14/10/2012
dc.source.conferencelocationKobe Japan
dc.title

Modeling challenges in nanoelectronics: an atomistic point of view

dc.typeMeeting abstract
dspace.entity.typePublication
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