Publication:

Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes

Date

2019-12

Proceedings Paper

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Files

40303.pdf 210.71 KB

Author(s)

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Vandooren, Anne

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Arimura, Hiroaki

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Horiguchi, Naoto

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Collaert, Nadine

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Linten, Dimitri

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Statistics

2013 since deposited on 2021-10-27

Acq. date: 2026-02-26