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Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes
Publication:
Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes
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Date
2019-12
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Wu, Zhicheng
;
Rzepa, Gerhard
;
Vandooren, Anne
;
Arimura, Hiroaki
;
Claes, Dieter
;
Horiguchi, Naoto
;
Collaert, Nadine
;
Linten, Dimitri
;
Grasser, Tibor
;
Kaczer, Ben
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2013
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Acq. date: 2025-12-10
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Views
2013
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-10
Citations