Publication:

Electron emission from deep traps in HfO 2 under thermal and optical excitation

Date

2024
Journal article
https://doi.org/10.1103/PhysRevB.109.134109
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dc.contributor.authorIzmailov, Roman
dc.contributor.authorStrand, Jack
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorShluger, Alexander
dc.contributor.authorAfanasiev, Valeri
dc.contributor.imecauthorIzmailov, Roman
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecIzmailov, Roman::0000-0003-1876-647X
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.date.accessioned2025-07-31T09:47:34Z
dc.date.available2024-06-12T17:21:25Z
dc.date.available2025-07-31T09:47:34Z
dc.date.embargo2024-04-17
dc.date.issued2024
dc.description.wosFundingTextVia the membership of J.S. and A.S. in the UK's HEC Materials Chemistry Consortium, which is funded by EPSRC (Grant No. EP/X035859), this work used the ARCHER2 UK National Supercomputing Service [75] . J.S. and A.S. ac-knowledge support from EPSRC Grant No. EP/R034540/1.
dc.identifier.doi10.1103/PhysRevB.109.134109
dc.identifier.issn2469-9950
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44021
dc.publisherAMER PHYSICAL SOC
dc.source.beginpageArt. 134109
dc.source.endpageN/A
dc.source.issue13
dc.source.journalPHYSICAL REVIEW B
dc.source.numberofpages12
dc.source.volume109
dc.subject.keywordsSMALL POLARONS
dc.subject.keywordsSTATES
dc.title

Electron emission from deep traps in HfO 2 under thermal and optical excitation

dc.typeJournal article
dspace.entity.typePublication
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