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Metal oxide EUV photoresist performance for N7 relevant patterns and processes
Publication:
Metal oxide EUV photoresist performance for N7 relevant patterns and processes
Date
2016
Proceedings Paper
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34343.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stowers, Jason
;
Anderson, Jeremy
;
Cardineau, Brian
;
Clark, Benjamin
;
De Schepper, Peter
;
Edson, Joseph
;
Greer, Michael
;
Jiang, Kai
;
Kocsis, Michael
;
Meyers, Stephen
;
Telecky, Alan
;
Grenville, Andrew
;
De Simone, Danilo
;
Gillijns, Werner
;
Vandenberghe, Geert
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1988
since deposited on 2021-10-23
2
last week
Acq. date: 2025-10-29
Citations
Metrics
Views
1988
since deposited on 2021-10-23
2
last week
Acq. date: 2025-10-29
Citations