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Conference contributions
Constant voltage electromigration for advanced BEOL copper interconnects
Publication:
Constant voltage electromigration for advanced BEOL copper interconnects
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tang, Baojun
;
Croes, Kristof
;
Jourdain, Anne
;
Boemmels, Juergen
;
Tokei, Zsolt
;
De Wolf, Ingrid
;
Wilcox, Eric
;
McMullen, Timothy
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1853
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Metrics
Views
1853
since deposited on 2021-10-22
3
last month
Acq. date: 2025-12-10
Citations