Publication:
Improvement of write/erase cycling of memory cells with SiO2/HfO2 tunnel dielectric
Date
| dc.contributor.author | Blomme, Pieter | |
| dc.contributor.author | Govoreanu, Bogdan | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.imecauthor | Blomme, Pieter | |
| dc.contributor.imecauthor | Govoreanu, Bogdan | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-15T04:02:11Z | |
| dc.date.available | 2021-10-15T04:02:11Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7225 | |
| dc.source.beginpage | 95 | |
| dc.source.conference | International Reliability Workshop Final Report | |
| dc.source.conferencedate | 13/10/2003 | |
| dc.source.conferencelocation | Lake Tahoe, CA USA | |
| dc.source.endpage | 98 | |
| dc.title | Improvement of write/erase cycling of memory cells with SiO2/HfO2 tunnel dielectric | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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