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De-process and physical characterization of HfO2 based resistive memory as studied by C-AFM
Publication:
De-process and physical characterization of HfO2 based resistive memory as studied by C-AFM
Date
2012
Meeting abstract
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25031.pdf
62.55 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Chen, Yangyin
;
Wouters, Dirk
;
Jurczak, Gosia
;
Vandervorst, Wilfried
Journal
Abstract
Description
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1928
since deposited on 2021-10-20
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Acq. date: 2025-10-24
Citations
Metrics
Views
1928
since deposited on 2021-10-20
419
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations