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De-process and physical characterization of HfO2 based resistive memory as studied by C-AFM

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1928 since deposited on 2021-10-20
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Acq. date: 2025-10-24

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1928 since deposited on 2021-10-20
419item.page.metrics.field.last-week
Acq. date: 2025-10-24

Citations