Publication:

The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

Date

2012
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBukhori, M. F.
dc.contributor.authorAsenov, Asen
dc.contributor.authorSchwarz, Benedikt
dc.contributor.authorBina, Markus
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-20T12:00:18Z
dc.date.available2021-10-20T12:00:18Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20888
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2012.6241839
dc.source.beginpage5A.2.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
dc.source.endpage5A.2.6
dc.title

The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

dc.typeProceedings paper
dspace.entity.typePublication
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