Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects

dc.contributor.author	Petrescu, Violeta
dc.contributor.author	Mouthaan, T.
dc.contributor.author	Schoenmaker, Wim
dc.contributor.author	Salm, C.
dc.date.accessioned	2021-10-01T08:39:32Z
dc.date.available	2021-10-01T08:39:32Z
dc.date.embargo	9999-12-31
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2853
dc.source.beginpage	1047
dc.source.endpage	1050
dc.source.issue	6_8
dc.source.journal	Microelectronics Reliability
dc.source.volume	38
dc.title	Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
dc.type	Journal article
dspace.entity.type	Publication
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