Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Write/erase degradation and disturb effects in source-side injection flash EEPROM devices
Publication:
Write/erase degradation and disturb effects in source-side injection flash EEPROM devices
Date
1995
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
996.pdf
439.09 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wellekens, Dirk
;
Van Houdt, Jan
;
Groeseneken, Guido
;
Maes, Herman
;
Faraone, Lorenzo
Journal
Quality and Reliability Engineering International
Abstract
Description
Metrics
Views
1946
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1946
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations