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Degradation and time dependent breakdown of stressed ferromagnetic tunnel junctions
Publication:
Degradation and time dependent breakdown of stressed ferromagnetic tunnel junctions
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Das, Johan
;
Degraeve, Robin
;
Boeve, Hans
;
Duchamps, Petra
;
Lagae, Liesbet
;
Groeseneken, Guido
;
Borghs, Gustaaf
;
De Boeck, Jo
Journal
Journal of Applied Physics
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1916
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Acq. date: 2026-01-25
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Views
1916
since deposited on 2021-10-14
2
last month
1
last week
Acq. date: 2026-01-25
Citations