Publication:

The low-frequency noise of strained Silicon n-MOSFETs

Date

2005
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorVerheyen, Peter
dc.contributor.authorDelhougne, Romain
dc.contributor.authorRooyackers, Rita
dc.contributor.authorLoo, Roger
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-16T05:06:00Z
dc.date.available2021-10-16T05:06:00Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11211
dc.source.beginpage187
dc.source.conferenceNoise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate19/09/2005
dc.source.conferencelocationSalamanca Spain
dc.source.endpage190
dc.title

The low-frequency noise of strained Silicon n-MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
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