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Characterisation of mechanical stresses of device isolation structures by micro-Raman spectroscopy and modelling
Publication:
Characterisation of mechanical stresses of device isolation structures by micro-Raman spectroscopy and modelling
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Date
1999
Proceedings Paper
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3508.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jones, S. K.
;
Ahmed, M.
;
Bazley, D. J.
;
Beanland, R. J.
;
De Wolf, Ingrid
;
Hill, C.
;
Rothwell, W. J.
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1978
since deposited on 2021-10-06
Acq. date: 2025-12-10
Citations
Metrics
Views
1978
since deposited on 2021-10-06
Acq. date: 2025-12-10
Citations