Publication:
Charging instability in n-channel MOSFETs with SiO2/HfO2 gate dielectrics
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1977 since deposited on 2021-10-14
1last month
Acq. date: 2026-03-16
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Statistics
Views
1977 since deposited on 2021-10-14
1last month
Acq. date: 2026-03-16
Citations