Publication:
Charging instability in n-channel MOSFETs with SiO2/HfO2 gate dielectrics
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1974 since deposited on 2021-10-14
2last month
2last week
Acq. date: 2026-01-08
Citations
Metrics
Views
1974 since deposited on 2021-10-14
2last month
2last week
Acq. date: 2026-01-08
Citations