Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Channel backscattering coefficient impact on FinFET devices with uniaxial/biaxial strain engineering
Publication:
Channel backscattering coefficient impact on FinFET devices with uniaxial/biaxial strain engineering
Copy permalink
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
20205.pdf
282.5 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rodrigues, Michele
;
Martino, J.A.
;
Collaert, Nadine
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1772
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1772
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-13
Citations