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Articles
Low-frequency noise characterizations of strained germanium pMOSFETs
Publication:
Low-frequency noise characterizations of strained germanium pMOSFETs
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Date
2011
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mitard, Jerome
;
De Jaeger, Brice
;
Eneman, Geert
;
Dobbie, A.
;
Myronov, M.
;
Whall, T.
;
Leadly, D.
;
Meuris, Marc
;
Hoffmann, Thomas Y.
;
Claeys, Cor
Journal
IEEE Transactions on Electron Devices
Abstract
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Views
1896
since deposited on 2021-10-19
2
last month
2
last week
Acq. date: 2025-12-10
Citations