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Characterization of (ultra)thin dielectrica
Publication:
Characterization of (ultra)thin dielectrica
Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
De Witte, Hilde
;
Conard, Thierry
;
Janssens, Tom
;
Schaekers, Marc
;
Brijs, Bert
;
Houssa, Michel
Journal
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1967
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1967
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations