Publication:
Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Date
| dc.contributor.author | Gramenova, Emilia | |
| dc.contributor.author | Jansen, Philippe | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Dupas, Luc | |
| dc.contributor.author | Deferm, Ludo | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Dupas, Luc | |
| dc.contributor.imecauthor | Deferm, Ludo | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-06T11:13:17Z | |
| dc.date.available | 2021-10-06T11:13:17Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3470 | |
| dc.source.beginpage | 359 | |
| dc.source.endpage | 363 | |
| dc.source.issue | 1 | |
| dc.source.journal | J. Electrochem. Soc. | |
| dc.source.volume | 146 | |
| dc.title | Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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