Publication:

Unexpected failure during HBM ESD stress in nanometer-scale nLDMOS-SCR devices

Date

2011

Proceedings Paper

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Files

22841.pdf 2.49 MB

Author(s)

Chen, Shih-Hung

;

;

Griffoni, Alessio

;

Linten, Dimitri

;

De Keersgieter, An

;

Groeseneken, Guido

Statistics

1939 since deposited on 2021-10-19

Acq. date: 2026-02-26