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Study of secondary electron injection phenomena in deep sub-micron MOSFETs and flash cells

Date

2000
Proceedings Paper
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dc.contributor.authorXue, Gang
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorWellekens, Dirk
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorLorenzini, Martino
dc.contributor.authorKeppens, Bart
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-14T14:21:34Z
dc.date.available2021-10-14T14:21:34Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4954
dc.source.beginpage144
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
dc.source.endpage147
dc.title

Study of secondary electron injection phenomena in deep sub-micron MOSFETs and flash cells

dc.typeProceedings paper
dspace.entity.typePublication
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