Publication:
Impact ionization related phenomena in Si MOSFETs operating at cryogenic temperatures
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1833 since deposited on 2021-09-30
6last month
3last week
Acq. date: 2026-08-09
Citations
Statistics
Views
1833 since deposited on 2021-09-30
6last month
3last week
Acq. date: 2026-08-09
Citations