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Impact ionization related phenomena in Si MOSFETs operating at cryogenic temperatures
Publication:
Impact ionization related phenomena in Si MOSFETs operating at cryogenic temperatures
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Date
1997
Proceedings Paper
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2115.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
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1825
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Acq. date: 2025-12-15
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Views
1825
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-15
Citations