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Charge trapping in SiOx/ZrO2 and SiOx/TiO2 gate dielectric stacks

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1900 since deposited on 2021-10-14
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Acq. date: 2025-12-09

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1900 since deposited on 2021-10-14
2last month
2last week
Acq. date: 2025-12-09

Citations