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Thermal stability and relaxation mechanisms in compressively-strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy
Publication:
Thermal stability and relaxation mechanisms in compressively-strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fleischmann, Claudia
;
Lieten, Ruben
;
Hermann, Peter
;
Hoenicke, Philipp
;
Beckhoff, Burkhard
;
Seidel, Felix
;
Douhard, Bastien
;
Richard, Olivier
;
Bender, Hugo
;
Shimura, Yosuke
;
Zaima, S
;
Uchida, Nori
;
Temst, Kristiaan
;
Vandervorst, Wilfried
;
Vantomme, Andre
Journal
Journal of Applied Physics
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1931
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1931
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations