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Radiation hardness of SiGe and Ge-based CMOS technologies
Publication:
Radiation hardness of SiGe and Ge-based CMOS technologies
Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Iacvo, C.
;
Mitard, Jerome
;
Arora, R.
;
Zhang, C.
;
Galloway, K.
;
Fleetwood, D.
;
Schrimpf, R.
;
Poizat, M.
;
Simoen, Eddy
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2052
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations
Metrics
Views
2052
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations