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SiON ARC: Material characterization and implication in lithographic process
Publication:
SiON ARC: Material characterization and implication in lithographic process
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Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Fenghong
;
Pollentier, Ivan
;
Eliat, Astrid
;
Delvaux, Christie
;
Ronse, Kurt
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Abstract
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1856
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1856
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-10
Citations