Publication:

Status of NODITO project

Date

1995
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSikula, J.
dc.contributor.authorVasina, Petr
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T13:16:27Z
dc.date.available2021-09-29T13:16:27Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/867
dc.source.beginpage11
dc.source.conferenceNoise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop
dc.source.conferencedate18/07/1995
dc.source.conferencelocationBrno Czech Republic
dc.source.endpage18
dc.title

Status of NODITO project

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
842.pdf
Size:
375.81 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions