Publication:

Unit-Cell-Based Approach for Electromigration Compliance Checks in VLSI Power Delivery Networks

Date

2025-JUN
Journal article
https://doi.org/10.1109/TDMR.2025.3566054
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dc.contributor.authorEsposto, Simone
dc.contributor.authorCiofi, Ivan
dc.contributor.authorSisto, Giuliano
dc.contributor.authorCroes, Kristof
dc.contributor.authorMilojevic, Dragomir
dc.contributor.authorZahedmanesh, Houman
dc.contributor.imecauthorEsposto, Simone
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorSisto, Giuliano
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorMilojevic, Dragomir
dc.contributor.imecauthorZahedmanesh, Houman
dc.contributor.orcidimecEsposto, Simone::0009-0004-4809-7806
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecSisto, Giuliano::0000-0001-8706-4311
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecZahedmanesh, Houman::0000-0002-0290-691X
dc.date.accessioned2025-06-19T03:57:58Z
dc.date.available2025-06-19T03:57:58Z
dc.date.issued2025-JUN
dc.identifier.doi10.1109/TDMR.2025.3566054
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45815
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage232
dc.source.endpage239
dc.source.issue2
dc.source.journalIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
dc.source.numberofpages8
dc.source.volume25
dc.subject.keywordsINTERCONNECTS
dc.subject.keywordsDELAY
dc.title

Unit-Cell-Based Approach for Electromigration Compliance Checks in VLSI Power Delivery Networks

dc.typeJournal article
dspace.entity.typePublication
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