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Silent Data Corruption: Test or Reliability Problem?
Publication:
Silent Data Corruption: Test or Reliability Problem?
Date
2024
Proceedings Paper
https://doi.org/10.1109/ETS61313.2024.10567773
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Dixit, Harish Dattatraya
;
Blanton, Shawn
;
Kuo, Aaron
;
Li, Wei
;
Mitra, Subhashish
;
Nigh, Chris
;
Purdy, Ruben
;
Kaczer, Ben
;
Sanganil, Dishant
;
Weckx, Pieter
;
Roussel, Philippe
;
Gielen, Georges
Journal
N/A
Abstract
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109
since deposited on 2024-08-23
Acq. date: 2025-10-23
Citations
Metrics
Views
109
since deposited on 2024-08-23
Acq. date: 2025-10-23
Citations