Publication:
Ultrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain
Date
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Simicic, Marko | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Chen, Shih-Hung | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.imecauthor | Van Beek, Simon | |
| dc.contributor.imecauthor | Simicic, Marko | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
| dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2021-10-29T05:50:16Z | |
| dc.date.available | 2021-10-29T05:50:16Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36115 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/9241218 | |
| dc.source.conference | 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) | |
| dc.source.conferencedate | 13/09/2020 | |
| dc.source.conferencelocation | Reno, NV USA | |
| dc.title | Ultrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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