Publication:

Characterizing oxide traps in the InGaAs/Al2O3 system with sulfur passivation

Date

2012
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Author(s)

Alian, AliReza  
;
Brammertz, Guy  
;
Degraeve, Robin  
;
Cho, Moon Ju
;
Caymax, Matty  
;
De Meyer, Kristin  
;
Heyns, Marc  

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1868 since deposited on 2021-10-20
Acq. date: 2026-03-17

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1868 since deposited on 2021-10-20
Acq. date: 2026-03-17

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