Publication:
Characterizing oxide traps in the InGaAs/Al2O3 system with sulfur passivation
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1870 since deposited on 2021-10-20
2last month
2last week
Acq. date: 2026-08-03
Citations
Statistics
Views
1870 since deposited on 2021-10-20
2last month
2last week
Acq. date: 2026-08-03
Citations