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Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubes
Publication:
Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubes
Date
1998
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meynants, Guy
;
Poortmans, Jef
;
Mertens, Robert
;
Jones, S.
;
Polce, N.
;
Blackstone, S.
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Abstract
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1924
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item.page.metrics.field.last-week
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Metrics
Views
1924
since deposited on 2021-10-01
420
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations