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Universal stress-defect correlation at (100)semiconductor/oxide interfaces

Date

2011
Journal article
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dc.contributor.authorHoussa, Michel
dc.contributor.authorScarrozza, Marco
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorAfanas'ev, Valery
dc.contributor.authorStesmans, Andre
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorStesmans, Andre
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.date.accessioned2021-10-19T14:23:37Z
dc.date.available2021-10-19T14:23:37Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19091
dc.source.beginpage141901
dc.source.issue14
dc.source.journalApplied Physics Letters
dc.source.volume98
dc.title

Universal stress-defect correlation at (100)semiconductor/oxide interfaces

dc.typeJournal article
dspace.entity.typePublication
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