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Articles
Resist surface investigations for reduction of line-edge-roughness in top surface imaging technology
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Resist surface investigations for reduction of line-edge-roughness in top surface imaging technology
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sugihara, Takashi
;
Van Roey, Frieda
;
Goethals, Mieke
;
Ronse, Kurt
;
Van den hove, Luc
Journal
Microelectronic Engineering
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since deposited on 2021-10-14
Acq. date: 2026-01-08
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since deposited on 2021-10-14
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Acq. date: 2026-01-08
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Downloads
1
since deposited on 2021-10-14
Acq. date: 2026-01-08
Views
1903
since deposited on 2021-10-14
2
last month
Acq. date: 2026-01-08
Citations