Publication:

A Pragmatic Model to Predict Future Device Aging

Date

2023
Journal article
https://doi.org/10.1109/ACCESS.2023.3329077
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dc.contributor.authorBrown, James
dc.contributor.authorTok, Kean Hong
dc.contributor.authorGao, Rui
dc.contributor.authorJi, Zhigang
dc.contributor.authorZhang, Weidong
dc.contributor.authorMarsland, John S.
dc.contributor.authorChiarella, Thomas
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorZhang, Jian Fu
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2024-02-12T14:41:56Z
dc.date.available2024-01-07T17:44:26Z
dc.date.available2024-02-12T14:41:56Z
dc.date.embargo2023-11-01
dc.date.issued2023
dc.description.wosFundingTextNo Statement Available
dc.identifier.doi10.1109/ACCESS.2023.3329077
dc.identifier.issn2169-3536
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43345
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage127725
dc.source.endpage127736
dc.source.issueN/A
dc.source.journalIEEE ACCESS
dc.source.numberofpages12
dc.source.volume11
dc.subject.keywordsHOT-CARRIER DEGRADATION
dc.subject.keywordsGENERATION
dc.subject.keywordsELECTRON
dc.subject.keywordsMOSFETS
dc.subject.keywordsTRAPS
dc.subject.keywordsREGIMES
dc.subject.keywordsIMPACT
dc.title

A Pragmatic Model to Predict Future Device Aging

dc.typeJournal article
dspace.entity.typePublication
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