Publication:

Single-electron capacitance spectroscopy of individual dopants in silicon

Date

2011-10
Journal article
https://doi.org/10.1021/nl2025163
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Author(s)

Gasseller, M.
;
DeNinno, M.
;
Loo, Roger  
;
Harrison, J.F
;
Caymax, Matty  
;
Rogge, S.
;
Tessmer, S.H.

Journal

Nano Letters

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