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Conference contributions
Characterization of a projection lens using the extended Nijboer-Zernike approach
Publication:
Characterization of a projection lens using the extended Nijboer-Zernike approach
Date
2002
Proceedings Paper
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18035.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dirksen, Peter
;
Braat, Joseph
;
De Bisschop, Peter
;
Janssen, Augustus J.E.M.
;
Juffermans, Casper
;
Williams, Alvina
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1910
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
Metrics
Views
1910
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations