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Electrical properties of InGaAs/high-k oxide interfaces: measurement and simulation
Publication:
Electrical properties of InGaAs/high-k oxide interfaces: measurement and simulation
Date
2010
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Brammertz, Guy
;
Lin, Dennis
;
Alian, AliReza
;
Merckling, Clement
;
Chang, Mark
;
Wang, Wei-E
;
Passlack, Matthias
;
Caymax, Matty
;
Meuris, Marc
;
Heyns, Marc
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1897
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1897
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations