Publication:

Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1889 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-27

Citations

Statistics

Views

1889 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-27

Citations