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Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
Publication:
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
Date
2007
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Giusi, G.
;
Crupi, F.
;
Simoen, Eddy
;
Eneman, Geert
;
Jurczak, Gosia
Journal
IEEE Trans. Electron Devices
Abstract
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1933
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1933
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations