Publication:
Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate
Date
| dc.contributor.author | De Roest, David | |
| dc.contributor.author | Ymeri, Hasan | |
| dc.contributor.author | Vandenberghe, S. | |
| dc.contributor.author | Stucchi, Michele | |
| dc.contributor.author | Schreurs, Dominique | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.author | Nauwelaers, Bart | |
| dc.contributor.imecauthor | De Roest, David | |
| dc.contributor.imecauthor | Stucchi, Michele | |
| dc.contributor.imecauthor | Schreurs, Dominique | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.imecauthor | Nauwelaers, Bart | |
| dc.date.accessioned | 2021-10-14T21:23:53Z | |
| dc.date.available | 2021-10-14T21:23:53Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6212 | |
| dc.source.beginpage | 103 | |
| dc.source.endpage | 104 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 23 | |
| dc.title | Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |