Publication:
Low-frequency noise behavior of nMOSFETs with different Al2O3 capping layer thickness and TiN gate
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1964 since deposited on 2021-10-27
2last month
Acq. date: 2026-03-01
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Views
1964 since deposited on 2021-10-27
2last month
Acq. date: 2026-03-01
Citations