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Radiation Characterization of a LEON5FT-based SoC on the DARE65T Platform

 
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cris.virtual.orcid0000-0002-0388-6498
cris.virtual.orcid0000-0002-4017-7033
cris.virtual.orcid0000-0003-0912-7131
cris.virtualsource.departmentc6a7c64f-cc6d-4073-a52e-4018ec595462
cris.virtualsource.department1e8df551-8fe0-41a7-88a2-dce01921eb1f
cris.virtualsource.department450b836f-09a6-4577-8139-9e6237b08b4b
cris.virtualsource.orcidc6a7c64f-cc6d-4073-a52e-4018ec595462
cris.virtualsource.orcid1e8df551-8fe0-41a7-88a2-dce01921eb1f
cris.virtualsource.orcid450b836f-09a6-4577-8139-9e6237b08b4b
dc.contributor.authorTambara, Lucas Antunes
dc.contributor.authorGorbunov, Maxim
dc.contributor.authorvan de Burgwal, Marcel
dc.contributor.authorBerti, Laurent
dc.contributor.authorHellstrom, Johan
dc.contributor.authorde Oliveira, Adria Barros
dc.contributor.authorNeren, Jan Andersson
dc.date.accessioned2026-06-15T11:38:00Z
dc.date.available2026-06-15T11:38:00Z
dc.date.createdwos2026-03-26
dc.date.issued2025
dc.description.abstractThis work presents the radiation characterization of a Frontgrade Gaisler’s LEON5FT-based SoC implemented on Imec’s DARE65T platform. Results show the effectiveness of both the platform and the processor’s fault tolerance in handling radiation-induced effects.
dc.identifier.doi10.1109/radecs66956.2025.11370352
dc.identifier.isbn979-8-3315-4688-5
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59688
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.beginpage41
dc.source.conferenceRADECS Data Workshop
dc.source.conferencedate2025-10-02
dc.source.conferencelocationAntwerpen
dc.source.endpage45
dc.source.journal2025 RADECS DATA WORKSHOP
dc.source.numberofpages5
dc.title

Radiation Characterization of a LEON5FT-based SoC on the DARE65T Platform

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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